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Conference Program |
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| Dr. Yervant Zorian |
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Dr. Yervant Zorian is the Vice President and Chief Scientist of Virage Logic Corp.
Previously, he was a Distinguished Member of Technical Staff at AT&T Bell
Laboratories, Princeton, New Jersey. He is currently the President of the IEEE
Test Technology Technical Council, and serves as the Editor-in-Chief Emeritus of
the Journal on Design & Test of Computers. He received an MS degree in Computer
Engineering from USC, a PhD in Electrical Engineering from McGill University,
and an MBA from Wharton School of Business, University of Pennsylvania. |
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Dr. Zorian has authored more than 300 scientific papers, four books, holds over 20 US patents, and received numerous best scientific paper awards. A Fellow of the IEEE, he was selected by Electornic Engineering Times among the top 13 influencers on the semiconductor industry in the past fifty years. Dr. Zorian was the 2005 recipient of the prestigious Industrial Pioneer Award, and the 2006 recipient
of the IEEE Hans Karlsson Award.
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