Tribute to Prof. Edward by Vishwani D Agarwal

Prof. Jacob Abraham


McCluskey, worked on electronic switching systems at the Bell Telephone Laboratories from 1955 to 1959. In 1959, he moved to Princeton University, where he was Professor of Electrical Engineering and Director of the University Computer Center. In 1966, he joined Stanford University, where he was Emeritus Professor of Electrical Engineering and Computer Science, as well as Director of the Center for Reliable Computing. He founded the Stanford Digital Systems Laboratory in 1969 and the Stanford Computer Engineering Program in 1970. The Stanford Computer Forum was started by McCluskey and two colleagues in 1970 and he was its Director until 1978. Professor McCluskey leads the Reliability and Testing Symposium. He has mentored over 70 PhD students and has an expanding family of academic ‘grandchildren’. He also has a hat collection. McCluskey served as the first President of the IEEE Computer Society. He died on February 13, 2016.

Speaker Biography

Vishwani D. Agrawal is a Distinguished Member of Technical Staff at Bell Labs, Murray Hill, New Jersey, USA, and a Visiting Professor at Rutgers University, New Brunswick, New Jersey, USA. He received a BSc degree from Allahabad University, BE degree from University of Roorkee, ME degree from the IISC, Bangalore, India,and a PhD degree from the University of Illinois at Urbana-Champaign. In 1986, he was elected an IEEE Fellow for his contributions to “probabilistic testing of integrated circuits.” In 1993, University of Illinois honored him with their Distinguished Alumnus Award. In 1998, he received the Harry H. Goode Award of the IEEE Computer Society for “innovative contributions to the field of electronic testing.” He has published 250 papers and five books, and has received five best paper awards. His recent text-book, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, co-authored with M. L. Bushnell has been published in November 2000. He holds thirteen U.S. patents. He has co-directed 12 PhD theses at major universities. In 1991 he co-founded the International Conference on VLSI Design. He is a former editor-in-chief of the IEEE Design & Test of Computers and the founding editor-in- chief of the Journal of Electronic Testing: Theory and Applications. He was the program chair for the Fourth IEEE Asian Test Symposium. He serves on the ECE Alumni Board of the University of Illinois and the ECE Advisory Board of the New Jersey Institute of Technology.